The One Stop Shop for Assessment of Semiconductor Life-Cycle
Portfolio of Services Offered
Moisture/Reflow Sensitivity Classification
JEDEC Preconditioning
High temperature operating life (HTOL) test
HTSL : The high-temperature storage life test
Highly Accelerated Temperature and Humidity Stress Test (HAST)
Steady-State Temperature Humidity Bias Life (THB)
Temperature Cycling Test (TCT)
Power and Temperature Cycling (PTC)
Thermal Shock Test, Liquid to Liquid
Autoclave (Pressure Pot)
Full Environmental Test
High Temperature Storage (HTS) and Low Temperature
POTC (Power ON Temperature Cycle)
ESD, HBM, MCM, CDM, and TLP
Latch up: High Current test on the ATE