Testimonials
iTest & Sentons successfully sorted wafers with 256 sites on V93000 Smartscale with Tokyo Electron’s Precio XL prober
I was challenged by my CEO to work on probe card for wafer sort project with 225 sites to support high volume to minimize the test cost with more than 57,000 dies per wafer. After studying and consulting with different probe card vendors as well as different test house services, I decided to work with 256 sites direct dock vertical probe card on Advantest V93000 Smartscale platform. I picked the iTest as the test house to support for this project and got a great support from iTest to get this project up and running within 2 weeks. We have transferred the product to offshore and currently running production. I also would like to take this opportunity to thank Corad company for their great support to make this project succeed.
I would strongly recommend to everyone to use the iTest test house where it has a great technical support for the testing service and a friendly environment.
Peter Dang